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Issue DateTitleAuthor(s)
2003-02A practical extracting method of PEB parameters by using rotating compensator spectroscopic ellipsometer오혜근
2003-02Prediction of the Critical Dimensions by Using a Threshold Energy Resist Model오혜근
2003-02A Practical Method of Extracting the Photoresist Exposure Parameters by Using A Dose-To-Clear Swing Curve오혜근
2003-02Resist Pattern Collapse Modeling for Smaller Features오혜근
2003-02Lithography Process Optimization Simulator for an Illumination System오혜근
2004-11Charge retention loss and its mechanism of (Bi,La)4Ti3O12 capacitors강보수
2004-11Bulk effects of the thermal flow resists오혜근
2004-03Dielectric properties of epitaxial Ba0.6Sr0.4TiO3 films on SiO2/Si using bi-axially oriented ion-beam-assisted deposited MgO as templates강보수
2004-11Tunable Kondo and Fano Resonances in Artificial Quantum-Dot Molecules정희준
2004-11Aerial image characterization for defects in an extreme-ultraviolet mask오혜근
2004-11Angular dependency of off-axis illumination on 100 nm width pattern printability for extreme ultraviolet lithography: Ru/Mo/Si reflector system오혜근
2004-11A study of process parameter control for nanopattern오혜근
2004-11Aerial Image Characterization for Defects in an Extreme-Ultraviolet Mask김옥경
2004-12Coulomb focusing corrections on bremsstrahlung emission from anisotropic bi-Lorentzian distribution plasmas정영대
2004-12Nonlinear effects on bremsstrahlung emission in dusty plasmas정영대
2004-12적응 웨이블렛 스펙트럼 차감법을 이용한 음성신호 개선에 관한 연구권영일
2004-12극자외선 리소그래피에서 마스크 결함에 의한 이미지 특징김옥경
2004-12염소를 포함한 액체에서의 금박막 패터닝과 표면 분석김옥경
2004-12실시간 분광 엘립소메트리를 이용한 a-Si박막의 crystallization 현상 연구김옥경
2004-12극자외선 리소그래피에서 마스크 결함에 의한 이미지 특징오혜근

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