2022-08 | Quantification of Substrate Current Caused by an Individual Trap at Different Locations and Energies, Prevailing on Si/SiO2 Interface or Si Substrate of n-MOSFETs | 백상현 |
2017-05 | A Quatro-Based 65-nm Flip-Flop Circuit for Soft-Error Resilience | 백상현 |
2019-09 | Radiation Reliability Benefit of Area-Optimized Interleaved Flip-Flop Layout in 28 nm Technology | 백상현 |
2004-10 | Removing JTAG Bottleneck in System Interconnect Test | 백상현 |
2017-04 | Resource-Efficient SRAM-Based Ternary Content Addressable Memory | 백상현 |
2008-09 | Ring Oscillator를 이용한 신호의 동시 스위칭 밀도 분석 | 백상현 |
2009-09 | Selection of the optimal interleaving distance for memories suffering MCUs | 백상현 |
2018-05 | Signal characteristic and test exploitation for intermittent nanometer-scale cracks | 백상현 |
2014-11 | Single Event Resilient Dynamic Logic Designs | 백상현 |
2018-09 | A single event upset tolerant latch design | 백상현 |
2016-02 | Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology | 백상현 |
2012-11 | Soft error issues with scaling technologies | 백상현 |
2017-04 | Soft error study on DDR4 SDRAMs using a 480 MeV proton beam | 백상현 |
2013-11 | Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication | 백상현 |
2010-10 | SRAM cell reliability degradations due to cell crosstalk | 백상현 |
2009-08 | SRAM Interleaving Distance Selection With a Soft Error Failure Model | 백상현 |
2016-12 | Statistical distributions of row-hammering induced failures in DDR3 components | 백상현 |
2015-04 | Stuck Bits Study in DDR3 SDRAMs Using 45-MeV Proton Beam | 백상현 |
2018-01 | Study of proton radiation effect to row hammer fault in DDR4 SDRAMs | 백상현 |
2018-05 | Study of TID effects on one row hammering using gamma in DDR4 SDRAMs | 백상현 |
2015-08 | Supply Voltage Dependence of Heavy Ion Induced SEEs on 65 nm CMOS Bulk SRAMs | 백상현 |
2023-01 | Temperature Estimation of HBM2 Channels with Tail Distribution of Retention Errors in FPGA-HBM2 Platform | 백상현 |
2022-12-22 | Temperature Estimation of HBM2 Channels with Tail Distribution of Retention Errors in FPGA-HBM2 Platform | 백상현 |
2017-02 | Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device | 백상현 |
2012-02 | Ternary Content Addressable Memory를 위한 저 전력 Rail-to-Rail 감지 증폭기 | 백상현 |
2020-10 | A theoretical and experimental investigation of Bragg's rule for energy-loss straggling in low mean energy loss regime in air and its constituents | 백상현 |
2012-12 | Vertically Partitioned SRAM-Based Ternary Content Addressable Memory | 백상현 |
2023-05-15 | Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components | 백상현 |
2015-06 | 중이온에 의한 SDRAM 컴포넌트의 리텐션 시간 측정 연구 | 백상현 |