| 2007-05 | An Efficient Buffer Management Scheme for Implementing a B-Tree on NAND Flash Memory | 이동호 |
| 2015-05 | Efficient diagnosis technique for aging defects on automotive semiconductor chips | 박성주 |
| 2006-05 | An Efficient Hierarchical Group Key Management Protocol for a Ubiquitous Computing Environment | 오희국 |
| 2005-10 | An Efficient Incremental Nearest Neighbor Algorithm for Processing k-Nearest Neighbor Queries with Visual and Semantic Predicates in Multimedia Information Retrieval Systems | 이동호 |
| 2005-05 | Efficient Interconnect Test Patterns and BIST Implementation for Crosstalk and Static Faults | 박성주 |
| 2006-11 | Efficient Interconnect Test Patterns for Crosstalk and Static Faults | 박성주 |
| 2008-06 | An Efficient Interconnect Test Patterns for Crosstalk and Static Faults | 박성주 |
| 2007-12 | An Efficient Link Controller for Test Access to IP Core-based Embedded System Chips | 박성주 |
| 2020-08 | Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain Reordering | 박성주 |
| 2000-01 | Efficient morphological segmentation using a new connected operator | 문영식 |
| 2014-06 | Efficient Parallel Scan Test Technique for Cores on AMBA-based SoC | 박성주 |
| 2009-08 | Efficient Path Rebuilding Algorithm for Grid Based WSN | 박성한 |
| 2016-04 | Efficient Pre-Bond Testing of TSV Defects Based on IEEE std. 1500 Wrapper Cells | 박성주 |
| 2008-10 | An Efficient Secure Scan Design for an SoC Embedding AES Core | 박성주 |
| 2004-06 | An Efficient Submesh Allocation Scheme Based on Classified Free Submesh List and Task Relocation | 전창호 |
| 2012-09 | Efficient Use of Unused Spare Columns for Reducing Memory Miscorrections | 박성주 |
| 2011-11 | Efficient use of unused spare columns to improve memory error correcting rate | 박성주 |
| 2005-11 | An Efficient Virtual Aesthetic Surgery Model Based On 2D Color Photograph | 문영식 |
| 2008-12 | Electron-emission properties of titanium carbide-coated carbon nanotubes grown on a nano-sized tungsten tip | 허신 |
| 2023-03 | An Empirical Comparison of Model-Agnostic Techniques for Defect Prediction Models | Scott Uk-Jin Lee |
