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An Efficient Interconnect Test Patterns for Crosstalk and Static Faults

Title
An Efficient Interconnect Test Patterns for Crosstalk and Static Faults
Author
박성주
Keywords
Interconnect test; crosstalk faults; static faults; test pattern
Issue Date
2008-06
Publisher
한국반도체테스트협회
Citation
제9회 한국테스트학술대회, A-1
Abstract
In this paper, we present efficient test patterns for the crosstalk–induced faults on System-on-a-Chip and board level interconnects considering actual effective aggressors to minimize the pattern size. All static faults also can be detected. The proposed method achieved the significant reduction of the number of test patterns than prior works, while preserving 100% fault coverage. We are in the process of extending the proposed technique to built-in-self test logics.
URI
http://www.koreatest.or.kr/sub02/2008data/report/9th_koreatest.pdfhttp://repository.hanyang.ac.kr/handle/20.500.11754/80410
Appears in Collections:
COLLEGE OF COMPUTING[E] > COMPUTER SCIENCE(소프트웨어학부) > Articles
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