AMBA; system-on-a-chip; scan test; IEEE 1500; parallel test; test time
Issue Date
2014-06
Publisher
IEEK PUBLICATION CENTER
Citation
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v. 14, NO. 3, Page. 345-355
Abstract
Today's System-on-a-Chip (SoC) is designed with reusable IP cores to meet short time-to-market requirements. However, the increasing cost of testing becomes a big burden in manufacturing a highly integrated SoC. In this paper, an efficient parallel scan test technique is introduced to minimize the test application time. Multiple scan enable signals are adopted to implement scan architecture to achieve optimal test application time for the test patterns scheduled for concurrent scan test. Experimental results show that testing times are considerably reduced with little area overhead.