Articles641 Collection home page

Browse

| Subscribe to this collection to receive daily e-mail notification of new additions 

Issue DateTitleAuthor(s)
2001-12Real-Time Spectroscopic Ellipsometric Studies of Photo-Assisted Chemical Processes안일신
2001-12Phase Diagram of a Disordered Boson Hubbard Model in Two Dimensions차민철
2001-12GaInAsP/InP Distributed Reflector Lasers Consisting of Deeply Etched Vertical Gratings심종인
2001-12Hydrogenation of ZnO:Al Thin Films Using Hot Filament안일신
2001-071.5㎛ Wavelength Distributed Reflector Lasers with Vertical Grating심종인
2001-07Thickness Reduction Effect in a Chemically Amplified Resit Simulator안일신
2001-07Extraction of Exposure PArameters for 193-nm Chemically Amplified Resist and Its Application to Simulation안일신
2001-08Alignment and Calibration of the MgF2 Biplate Compensator for Applications in Rotating Compensator Multichannel Ellipsometry안일신
2001-08Raman study of an electric-field-induced phase transition in Pb(Zn_1/3Nb_2/3)O_3-8%PbTiO_3김수은
2001-021.55㎛ InGaAsP/InGaAsP MQW 광흡수 변조기에서 구조변수가 소광특성에 미치는 영향심종인
2001-02The effect of NaCl melt-additive on the growth and morphology of LiB3O5 (LBO) crystals김지원
2001-02Calibrations in rotating compensator spectroscopic ellipsometry안일신
2001-02초전도체-부도체 상전이에서의 에너지 gap의 유한 크기 축적차민철
2001-02자기장에 의해서 f=1/4인 경우 조셉슨접합 배열의 초전도체-부도체 상전이차민철
2001-02갈륨-비소 반도체 소자의 단전자 수송에 관한 몬테칼로 시늉내기차민철
2001-02Adsorption of water molecules on stainless steel surface using null ellipsometry안일신
2001-03Post Exposure Delay Considerations in a 193-nm Chemically Amplified Resist안일신
2001-05Silicon substrate coupling noise modeling, analysis, and experimental verification for mixed signal integrated circuit design심종인
2001-06Fast and Accurate Quasi-3-Dimensional Capacitance Determination of Multilayer VLSI Interconnects심종인
2001-06공진현상 감소를 위한 집적회로 패키지 설계 및 모델링심종인

BROWSE