| 2009-05 | Analysis of low power sensor node using data compression | 백상현 |
| 2009-08 | SRAM Interleaving Distance Selection With a Soft Error Failure Model | 백상현 |
| 2009-08 | Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential Signaling | 백상현 |
| 2009-09 | Selection of the optimal interleaving distance for memories suffering MCUs | 백상현 |
| 2009-10 | A di/dt Compensation Technique in Delay Testing by Disconnecting Power Pins | 백상현 |
| 2010-04 | Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals | 백상현 |
| 2010-06 | Optimizing Scrubbing Sequences for Advanced Computer Memories | 백상현 |
| 2010-08 | Protection of Memories Suffering MCUs Through the Selection of the Optimal Interleaving Distance | 백상현 |
| 2010-10 | SRAM cell reliability degradations due to cell crosstalk | 백상현 |
| 2011-03 | Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations | 백상현 |
| 2011-04 | AC-DC factor sensitivity for DRAM components lifetime under hot-carrier injection | 백상현 |
| 2011-04 | Multiple cell upsets tolerant content-addressable memory | 백상현 |
| 2011-07 | DRAM failure cases under hot-carrier injection | 백상현 |
| 2011-10 | Mitigating the Effects of Large Multiple Cell Upsets (MCUs) in Memories | 백상현 |
| 2012-02 | Ternary Content Addressable Memory를 위한 저 전력 Rail-to-Rail 감지 증폭기 | 백상현 |
| 2012-09 | Comparative study of MC-50 and ANITA neutron beams by using 55 nm SRAM | 백상현 |
| 2012-11 | Soft error issues with scaling technologies | 백상현 |
| 2012-12 | Vertically Partitioned SRAM-Based Ternary Content Addressable Memory | 백상현 |
| 2012-12 | Hybrid Partitioned SRAM-Based Ternary Content Addressable Memory | 백상현 |
| 2012-12 | Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress | 백상현 |
