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Showing results 14 to 33 of 88

Issue DateTitleAuthor(s)
2017-07BPPT - Bulk potential protection technique for hardened sequentials백상현
2017-07BPPT–Bulk Potential Protection Technique for Hardened Sequentials백상현
2005-09Built-In Null Detector Design For AC-Coupled Differential Receive Buffer백상현
2012-12Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress백상현
2012-09Comparative study of MC-50 and ANITA neutron beams by using 55 nm SRAM백상현
2019-08Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers백상현
2023-01DDR4 Ball Grid Array Package Intermittent Fracture Effect on Signal Integrity백상현
2023-01-23DDR4 Ball Grid Array Package Intermittent Fracture Effect on Signal Integrity백상현
2021-04DDR4 BER Degradation Due to Crack in FBGA Package Solder Ball백상현
2021-04DDR4 Data Channel Failure Due to DC Offset Caused by Intermittent Solder Ball Fracture in FBGA Package백상현
2007-12Delay Fault Coverage Enhancement by Partial Clocking For Low Power Designs with Heavily Gated Clocks백상현
2007-12Delay fault coverage enhancement by partial clocking for low-power designs with heavily gated clocks백상현
2011-03Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations백상현
2011-06Designing ad-hoc scrubbing sequences to improve memory reliability against soft errors백상현
2022-05Divulge of Root Cause Failure in Individual Cells of 2x nm Technology DDR4 DRAM at Operating Temperature백상현
2011-07DRAM failure cases under hot-carrier injection백상현
2006-11Efficient Interconnect Test Patterns for Crosstalk and Static Faults백상현
2020-05Energy straggling and an experimental investigation of Bragg's rule for Am-241 alpha particles in air and its constituents백상현
2017-01Evaluation of SEU Performance of 28-nm FDSOI Flip-Flop Designs백상현
2019-08Experimental Exploitation of Random and Deterministic Data Patterns for Stringent DDR4 I/O Timing Margins백상현

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