| 2008-05 | Effect of a guard-ring on the leakage current in a Si-PIN X-ray detector for a single photon counting sensor | 박진구 |
| 2011-10 | Effect of Acoustic Cavitation on Dissolved Gases and Their Characterization During Megasonic Cleaning | 박진구 |
| 2010-12 | Effect of acoustic cavitation on dissolved gases and their characterization during megasonic cleaning | 박진구 |
| 2004-11 | The Effect of Additives in Post Cu CMP Cleaning on Particle Adhesion and Removal | 박진구 |
| 2012-06 | Effect of Alkaline pH on Polishing and Etching of Single and Polycrystalline Silicon | 박진구 |
| 2012-07 | Effect of Alkaline pH on Polishing and Etching of Single and Polycrystalline Silicon | 박진구 |
| 2023-03-22 | Effect of ammonium halide salts on wet chemical nanoscale etching and polishing of InGaAs surfaces for advanced CMOS devices | 박진구 |
| 2000-01 | Effect of Chemicals and Slurry Particles on Chemical Mechamical Polishing of Polyimide | 박진구 |
| 2000-03 | Effect of chemicals and slurry particles on chemical mechanical polishing of polyimide | 박진구 |
| 2005-11 | Effect of Corrosion inhibitor, Benzotriazole(BTA), on Particle Adhesion in Cu CMP | 박진구 |
| 2008-01 | Effect of Corrosion Inhibitor, Benzotriazole, in Cu Slurry on Cu Polishing | 박진구 |
| 2006-12 | Effect of diamonds on pad recovery in oxide and metal pad conditioning process | 박진구 |
| 2010-04 | Effect of Different Deposition Mediums on the Adhesion and Removal of Particles | 박진구 |
| 2014-02 | Effect of dissolved gases in water on acoustic cavitation and bubble growth rate in 0.83 MHz megasonic of interest to wafer cleaning | 박진구 |
| 2014-07 | Effect of dissolved gases in water on acoustic cavitation and bubble growth rate in 0.83 MHz megasonic of interest to wafer cleaning | 박진구 |
| 2021-02 | Effect of Dissolved Oxygen on Removal of Benzotriazole from Co during a Post-Co CMP Cleaning | 박진구 |
| 2016-10 | Effect of Feature Spacing When Injection Molding Parts With Microstructured Surfaces | 박진구 |
| 2014-12 | Effect of FOUP atmosphere control on process wafer integrity in sub20 nm device fabrication | 박진구 |
| 2015-01 | Effect of FOUP atmosphere control on process wafer integrity in sub20nm device fabrication | 박진구 |
| 2014-05 | Effect of La doping of ceria abrasives for STI CMP | 박진구 |
