32 nm 1:1 line and space patterning by resist reflow process
- Title
- 32 nm 1:1 line and space patterning by resist reflow process
- Author
- 정희준
- Keywords
- 32 nm line and space half-pitch; Navier-Stokes equation; Resist reflow process
- Issue Date
- 2008-03
- Publisher
- SPIE-the International Society for Optical Engineering
- Citation
- Proceedings of SPIE - The International Society for Optical Engineering, v. 6924, Article no. 69244S
- Abstract
- Making a sub-32 nm line and space pattern is the most important issue in semiconductor process. Specially, it
is important to make line and space pattern when the device type is NAND flash memory because the unit cell is mostly
composed of line and space pattern. Double patterning method is regarded as the most promising technology for sub-32
nm half-pitch node. However, double patterning method is expensive for the production and heavy data split is required.
In order to make cheaper and easier patterning, we suggest a resist reflow process (RRP) method for 32 nm 1:1 line and
space pattern. It is easier to make 1:3 pitch than 1:1 pitch line and space in terms of aerial image, and RRP can make 1:3
pitch aerial image to 1:1 resist image. We used home-made RRP simulation based on Navier-Stokes equation including
surface tension effect. Solid-E is used for optical simulation, and e-beam lithography is used for the experiment to check
the concept.
- URI
- https://www.spiedigitallibrary.org/conference-proceedings-of-spie/6924/1/32-nm-1-1-line-and-space-patterning-by-resist/10.1117/12.772133.full?SSO=1https://repository.hanyang.ac.kr/handle/20.500.11754/80249
- ISSN
- 0277-786X
- DOI
- 10.1117/12.772133
- Appears in Collections:
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > APPLIED PHYSICS(응용물리학과) > Articles
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