| 2008-05 | Low Cost Scan Test for IEEE 1500-Based SoC | 박성주 |
| 2016-10 | Low Power Scan Chain Reordering Method with Limited Routing Congestion for Code-based Test Data Compression | 박성주 |
| 2008-05 | Low-cost scan test for IEEE-1500-Based SoC | 박성주 |
| 2002-04 | Microcode-based memory BIST implementing modified march algorithms | 박성주 |
| 2011-04 | Multiple cell upsets tolerant content-addressable memory | 박성주 |
| 2004-07 | A New Design of High Speed Parallel CRC Generator | 박성주 |
| 2004-10 | A New State Assignment Technique for Testing and Low Power | 박성주 |
| 2003-02 | A New State Assignment Technique for Testing and Low Power | 박성주 |
| 2004-06 | A New State Assignment Technique for Testing and Low Power | 박성주 |
| 2004-02 | A new synthesis technique of sequential circuits for low power and testing | 박성주 |
| 2017-07 | On Diagnosing the Aging Level of Automotive Semiconductor Devices | 박성주 |
| 2010-07 | On-Chip Support for NoC-Based SoC Debugging | 박성주 |
| 2008-06 | Optimal SoC Test Interface for Wafer and Final Tests | 박성주 |
| 2006-10 | Parallel CRC Logic Optimization Algorithm for High Speed Communication Systems | 박성주 |
| 2009-11 | Parallel test method for NoC-based SoCs | 박성주 |
| 2011-04 | Performance Improvement by Logic Sharing on Using Unused Spare Columns for Memory EC | 박성주 |
| 2004-10 | A Reconfigurable Test Access Mechanism for Embedded Core Test | 박성주 |
| 2011-08 | Redundancy TSV 연결 테스트를 위한 래퍼셀 설계 | 박성주 |
| 2014-01 | Reliability issues for automobile SoCs | 박성주 |
| 2015-11 | SCAN-PUF: PUF Elements Selection Methods for Viable IC Identification | 박성주 |
