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A New State Assignment Technique for Testing and Low Power

Title
A New State Assignment Technique for Testing and Low Power
Author
박성주
Keywords
State Encoding; Fault Coverage; Low power; Scan design
Issue Date
2004-06
Publisher
IEEE ACM
Citation
DAC '04: Proceedings of the 41st annual Design Automation Conference, Page. 510-513
Abstract
In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feedback cycles are reduced with minimal switching activity on the state variables. Experiment shows significant improvement in power dissipation and testabilities for benchmark circuits.
URI
https://dl.acm.org/doi/abs/10.1145/996566.996707https://repository.hanyang.ac.kr/handle/20.500.11754/151007
ISSN
0738-100X
DOI
10.1145/996566.996707
Appears in Collections:
COLLEGE OF COMPUTING(소프트웨어융합대학)[E] > COMPUTER SCIENCE(소프트웨어학부) > Articles
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