Designing ad-hoc scrubbing sequences to improve memory reliability against soft errors
- Title
- Designing ad-hoc scrubbing sequences to improve memory reliability against soft errors
- Author
- 백상현
- Keywords
- memories; Multiple Cell Upsets (MCUs); radiation; reliability; scrubbing
- Issue Date
- 2011-06
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Citation
- Proceedings - Design Automation Conference, article no. 5981865, Page. 700-705
- Abstract
- In this paper, we propose the use of ad-hoc scrubbing sequences to improve memory reliability. The key idea is to exploit the locality of the errors caused by a Multiple Cell Upset (MCU) to make scrubbing more efficient. The starting point is the MCU distributions for a given device. A procedure is presented that uses that information to determine an ad-hoc scrubbing sequence that maximizes reliability. The approach is then applied to a case study and results show a significant increase in the Mean Time To Failure (MTTF) compared with traditional scrubbing. © 2011 ACM.
- URI
- https://dl.acm.org/doi/10.1145/2024724.2024882https://repository.hanyang.ac.kr/handle/20.500.11754/183610
- ISSN
- 0738-100X
- DOI
- 10.1145/2024724.2024882
- Appears in Collections:
- COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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