Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 백상현 | - |
dc.date.accessioned | 2023-07-14T01:24:24Z | - |
dc.date.available | 2023-07-14T01:24:24Z | - |
dc.date.issued | 2011-06 | - |
dc.identifier.citation | Proceedings - Design Automation Conference, article no. 5981865, Page. 700-705 | - |
dc.identifier.issn | 0738-100X | - |
dc.identifier.uri | https://dl.acm.org/doi/10.1145/2024724.2024882 | en_US |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/183610 | - |
dc.description.abstract | In this paper, we propose the use of ad-hoc scrubbing sequences to improve memory reliability. The key idea is to exploit the locality of the errors caused by a Multiple Cell Upset (MCU) to make scrubbing more efficient. The starting point is the MCU distributions for a given device. A procedure is presented that uses that information to determine an ad-hoc scrubbing sequence that maximizes reliability. The approach is then applied to a case study and results show a significant increase in the Mean Time To Failure (MTTF) compared with traditional scrubbing. © 2011 ACM. | - |
dc.language | en | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.subject | memories | - |
dc.subject | Multiple Cell Upsets (MCUs) | - |
dc.subject | radiation | - |
dc.subject | reliability | - |
dc.subject | scrubbing | - |
dc.title | Designing ad-hoc scrubbing sequences to improve memory reliability against soft errors | - |
dc.type | Article | - |
dc.identifier.doi | 10.1145/2024724.2024882 | - |
dc.relation.page | 700-705 | - |
dc.relation.journal | Proceedings - Design Automation Conference | - |
dc.contributor.googleauthor | Reviriego, Pedro | - |
dc.contributor.googleauthor | Maestro, Juan Antonio | - |
dc.contributor.googleauthor | Baeg, Sanghyeon | - |
dc.sector.campus | E | - |
dc.sector.daehak | 공학대학 | - |
dc.sector.department | 전자공학부 | - |
dc.identifier.pid | bau | - |
dc.identifier.article | 5981865 | - |
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