A comprehensive signature analysis scheme for oscillation-test
- Title
- A comprehensive signature analysis scheme for oscillation-test
- Author
- 노정진
- Keywords
- Built-in self-test (BIST); design for test; mixed-signal test; oscillation test; singature analysis
- Issue Date
- 2003-10
- Publisher
- IEEE
- Citation
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, v. 22, issue. 10, page. 1409-1423
- Abstract
- A low-cost and comprehensive built-in self-test (BIST) methodology for analog and mixed-signal circuits is described. We implement a time-division multiplexing (TDM) comparator to analyze the response of a circuit under test with minimum hardware overhead. The TDM comparator scheme is an effective signature analyzer for on-chip analog response compaction and pass/fail decision. We apply this scheme to an oscillation-test environment and implement a low-cost and comprehensive vectorless BIST methodology for high fault and yield coverage. Our scheme allows a tolerance in the output response, a feature necessary for analog circuits. Both oscillation frequency and oscillation amplitude are measured indirectly to increase the fault coverage. We provide a theoretical analysis of the oscillation that explains why the amplitude measurement is essential. Simulation results demonstrate that the proposed scheme can significantly reduce test time of the oscillation-test while achieving higher fault coverage.
- URI
- https://ieeexplore.ieee.org/document/1233826?arnumber=1233826&SID=EBSCO:edseeehttps://repository.hanyang.ac.kr/handle/20.500.11754/156395
- ISSN
- 0278-0070; 1937-4151
- DOI
- 10.1109/TCAD.2003.818133
- Appears in Collections:
- COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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