Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 노정진 | - |
dc.date.accessioned | 2020-12-21T01:30:42Z | - |
dc.date.available | 2020-12-21T01:30:42Z | - |
dc.date.issued | 2003-10 | - |
dc.identifier.citation | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, v. 22, issue. 10, page. 1409-1423 | en_US |
dc.identifier.issn | 0278-0070 | - |
dc.identifier.issn | 1937-4151 | - |
dc.identifier.uri | https://ieeexplore.ieee.org/document/1233826?arnumber=1233826&SID=EBSCO:edseee | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/156395 | - |
dc.description.abstract | A low-cost and comprehensive built-in self-test (BIST) methodology for analog and mixed-signal circuits is described. We implement a time-division multiplexing (TDM) comparator to analyze the response of a circuit under test with minimum hardware overhead. The TDM comparator scheme is an effective signature analyzer for on-chip analog response compaction and pass/fail decision. We apply this scheme to an oscillation-test environment and implement a low-cost and comprehensive vectorless BIST methodology for high fault and yield coverage. Our scheme allows a tolerance in the output response, a feature necessary for analog circuits. Both oscillation frequency and oscillation amplitude are measured indirectly to increase the fault coverage. We provide a theoretical analysis of the oscillation that explains why the amplitude measurement is essential. Simulation results demonstrate that the proposed scheme can significantly reduce test time of the oscillation-test while achieving higher fault coverage. | en_US |
dc.description.sponsorship | This work was supported in part by the National Science Foundation under Grant CCR-9731433 and in part by Subcontract SA3271JB from the University of California Berkeley under Prime Contract 98-DT-660 from Microelectronic Advanced Research Corporation. This paper was recommended by Associate Editor R. C. Aitken. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | IEEE | en_US |
dc.subject | Built-in self-test (BIST) | en_US |
dc.subject | design for test | en_US |
dc.subject | mixed-signal test | en_US |
dc.subject | oscillation test | en_US |
dc.subject | singature analysis | en_US |
dc.title | A comprehensive signature analysis scheme for oscillation-test | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TCAD.2003.818133 | - |
dc.relation.journal | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND | - |
dc.contributor.googleauthor | Roh, Jeongjin | - |
dc.contributor.googleauthor | Abraham, J.A. | - |
dc.relation.code | 2012203857 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF ENGINEERING SCIENCES[E] | - |
dc.sector.department | DIVISION OF ELECTRICAL ENGINEERING | - |
dc.identifier.pid | jroh | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.