Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김옥경 | - |
dc.date.accessioned | 2020-11-11T07:03:34Z | - |
dc.date.available | 2020-11-11T07:03:34Z | - |
dc.date.issued | 2003-03 | - |
dc.identifier.citation | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, v.42, Issue.3, Page.1416-1417 | en_US |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | https://iopscience.iop.org/article/10.1143/JJAP.42.1416 | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/155424 | - |
dc.description.abstract | Spectroscopic ellipsometry (SE) and X-ray photoelectron spectroscopy (XPS) were employed to study the composite thin films of SiO and cobalt (Co) prepared by sputtering technique. The optical properties of these films could be expressed as mixtures of SiO and Co using effective medium approximation (EMA) by Bruggeman. When the compositional properties of films analyzed by EMA and XPS were compared, the optical volume of SiO was found to be 5.47 times greater than that of Co. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | INST PURE APPLIED PHYSICS | en_US |
dc.subject | SiO | en_US |
dc.subject | cobalt | en_US |
dc.subject | ellipsometry | en_US |
dc.subject | effective medium theory | en_US |
dc.title | Optical Properties of the SiO-Co Composite Thin Films | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1143/jjap.42.1416 | - |
dc.relation.journal | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & | - |
dc.contributor.googleauthor | Lee, J. | - |
dc.contributor.googleauthor | Bang, K.-Y. | - |
dc.contributor.googleauthor | Kim, O.-K. | - |
dc.contributor.googleauthor | Oh, H.-K. | - |
dc.contributor.googleauthor | An, I. | - |
dc.contributor.googleauthor | Choi, C. | - |
dc.contributor.googleauthor | Park, C.-W. | - |
dc.relation.code | 2012204500 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E] | - |
dc.sector.department | DEPARTMENT OF APPLIED PHYSICS | - |
dc.identifier.pid | 1790146 | - |
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