Structural and Ferroelectric Properties of P(VDF-TrFE) Thin Films Depending on The Annealing Temperature
- Title
- Structural and Ferroelectric Properties of P(VDF-TrFE) Thin Films Depending on The Annealing Temperature
- Author
- 김우희
- Keywords
- P(VDF-TrFE) thin film; Piezoelectricity; Ferroelectricity; Crystallization temperature; Needle-like structure
- Issue Date
- 2019-03
- Publisher
- ELSEVIER SCIENCE BV
- Citation
- MATERIALS LETTERS, v. 238, Page. 294-297
- Abstract
- Organic P(VDF-TrFE) 70/30 copolymer thin films were prepared on ITO/glass substrates at 110-150 degrees C by spin coating. All the P(VDF-TrFE) thin films exhibited ferroelectric beta-phase crystallinity in X-ray diffraction analysis. The polarization-electric field hysteresis analysis revealed that the P(VDF-TrFE) thin film annealed at 140 degrees C has superior ferroelectric properties with a high remanent polarization of 8.02 mu C/cm(2). From atomic force microscopic characterization, we observed lamellar and needle-like structures in the P(VDF-TrFE) thin film annealed at 140 degrees C. Further, piezoelectric force microscopic measurements confirmed a much higher piezoelectric property of the P(VDF-TrFE) thin film annealed at 140 degrees C than those of the films annealed at other temperatures. (C) 2018 Elsevier B.V. All rights reserved.
- URI
- https://www.sciencedirect.com/science/article/pii/S0167577X18319293https://repository.hanyang.ac.kr/handle/20.500.11754/112613
- ISSN
- 0167-577X; 1873-4979
- DOI
- 10.1016/j.matlet.2018.11.156
- Appears in Collections:
- COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MATERIALS SCIENCE AND CHEMICAL ENGINEERING(재료화학공학과) > Articles
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