Repository at Hanyang UniversityCOLLEGE OF ENGINEERING SCIENCES[E](공학대학)MATERIALS SCIENCE AND CHEMICAL ENGINEERING(재료화학공학과)Articles
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dc.contributor.author김우희-
dc.date.accessioned2019-11-20T07:28:47Z-
dc.date.available2019-11-20T07:28:47Z-
dc.date.issued2019-03-
dc.identifier.citationMATERIALS LETTERS, v. 238, Page. 294-297en_US
dc.identifier.issn0167-577X-
dc.identifier.issn1873-4979-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S0167577X18319293-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/112613-
dc.description.abstractOrganic P(VDF-TrFE) 70/30 copolymer thin films were prepared on ITO/glass substrates at 110-150 degrees C by spin coating. All the P(VDF-TrFE) thin films exhibited ferroelectric beta-phase crystallinity in X-ray diffraction analysis. The polarization-electric field hysteresis analysis revealed that the P(VDF-TrFE) thin film annealed at 140 degrees C has superior ferroelectric properties with a high remanent polarization of 8.02 mu C/cm(2). From atomic force microscopic characterization, we observed lamellar and needle-like structures in the P(VDF-TrFE) thin film annealed at 140 degrees C. Further, piezoelectric force microscopic measurements confirmed a much higher piezoelectric property of the P(VDF-TrFE) thin film annealed at 140 degrees C than those of the films annealed at other temperatures. (C) 2018 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipThis research was supported by the Basic Science Research Program through the National Research Foundation of South Korea (NRF) funded by the Ministry of Education of South Korea (No. 2018R1A6A3A11045896) and a National Research Foundation of South Korea (NRF) grant funded by the South Korean Government (MSIP) (No. NRF-2017R1C1B5076821). This research is supported by "Rediscovery of the Past R&D Result" through the Ministry of Trade of South Korea, Industry and Energy (MOTIE) and the South Korea Institute for Advancement of Technology (KIAT) (Grant No.: P0004074).en_US
dc.language.isoen_USen_US
dc.publisherELSEVIER SCIENCE BVen_US
dc.subjectP(VDF-TrFE) thin filmen_US
dc.subjectPiezoelectricityen_US
dc.subjectFerroelectricityen_US
dc.subjectCrystallization temperatureen_US
dc.subjectNeedle-like structureen_US
dc.titleStructural and Ferroelectric Properties of P(VDF-TrFE) Thin Films Depending on The Annealing Temperatureen_US
dc.typeArticleen_US
dc.relation.volume238-
dc.identifier.doi10.1016/j.matlet.2018.11.156-
dc.relation.page294-297-
dc.relation.journalMATERIALS LETTERS-
dc.contributor.googleauthorSeo, Jeongdae-
dc.contributor.googleauthorSon, Jong Yeog-
dc.contributor.googleauthorKim, Woo-Hee-
dc.relation.code2019002541-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING-
dc.identifier.pidwooheekim-
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