Effect of conductive LaNiO3 electrode on the structural and ferroelectric properties of Bi3.25La0.75Ti3O12 films
- Title
- Effect of conductive LaNiO3 electrode on the structural and ferroelectric properties of Bi3.25La0.75Ti3O12 films
- Author
- 강보수
- Issue Date
- 2006-12
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v. 89, No. 24, Article no. 242903
- Abstract
- Ferroelectric Bi3.25La0.75Ti3O12 (BLT) films were grown on Pt/Ti/SiO2/Si (Pt/Si), LaNiO3/Pt/Si, and LaNiO3/Si substrates using chemical solution deposition technique. X-ray diffraction analysis shows that films grown on conductive LaNiO3 electrodes had higher degree of (117) orientation as compared to that grown directly on Pt/Si substrate. High remanent polarization value (2P(r))similar to 43.14 mu C/cm(2) (E-c of 111 kV/cm) under an applied field of 396 kV/cm was obtained for BLT film on LaNiO3/Pt/Si as compared to a value of 26 mu C/cm(2) obtained for BLT film on Pt/Si directly. There was no degradation in the switchable polarization (P-sw-P-ns) after 10(10) switching cycles. (c) 2006 American Institute of Physics.
- URI
- https://aip.scitation.org/doi/abs/10.1063/1.2404949https://repository.hanyang.ac.kr/handle/20.500.11754/109991
- ISSN
- 0003-6951; 1077-3118
- DOI
- 10.1063/1.2404949
- Appears in Collections:
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > APPLIED PHYSICS(응용물리학과) > Articles
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