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COLLEGE OF ENGINEERING SCIENCES[E](공학대학)
ELECTRICAL ENGINEERING(전자공학부)
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Results 1-9 of 9 (Search time: 0.002 seconds).
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Issue Date
Title
Author(s)
2017-05
A Quatro-Based 65-nm Flip-Flop Circuit for Soft-Error Resilience
백상현
2016-02
Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology
백상현
2016-11
An Area Efficient Stacked Latch Design Tolerant to SEU in 28 nm FDSOI Technology
백상현
2017-01
Evaluation of SEU Performance of 28-nm FDSOI Flip-Flop Designs
백상현
2015-04
An SEU-Tolerant DICE Latch Design With Feedback Transistors
백상현
2013-04
Memory Reliability Analysis for Multiple Block Effect of Soft Errors
백상현
2010-04
Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals
백상현
2010-06
Optimizing Scrubbing Sequences for Advanced Computer Memories
백상현
2010-08
Protection of Memories Suffering MCUs Through the Selection of the Optimal Interleaving Distance
백상현
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radiation hardening
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single event upset
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memory
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SRAMS
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stacked structure
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65 NM CMOS
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Charge sharing
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Clock jitter
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