2014-03 | Low temperature studies of the efficiency droop in InGaN-based light-emitting diodes | 신동수 |
2013-12 | Low temperature studies of the efficiency droop in InGaN-based light-emitting diodes | 신동수 |
2008-05 | Low-detuning operation of electroabsorption modulator as a zero-bias optical transceiver for picocell radio-over-fiber applications | 신동수 |
2016-01 | Low-frequency noise characteristics of InGaN-based light-emitting diodes | 신동수 |
2005-12 | Mask modification for the shadow effect reduction by Rigorous coupled-wave analysis in extreme ultraviolet lithography | 신동수 |
2012-02 | Measurement of internal electric field in GaN-based light-emitting diodes | 신동수 |
2012-04 | Measurement of Internal Electric Field in GaN-Based Light-Emitting Diodes | 신동수 |
2011-01 | Measurement of nonuniform bowing in GaN/sapphire epi-wafers and subsequent stress analysis by using a theoretical model | 신동수 |
2011-03 | Measurement of nonuniform bowing in GaN/sapphire epi-wafers and subsequent stress analysis by using a theoretical model | 신동수 |
2014-09 | Measurement of piezoelectric field in single- and double-quantum-well green LEDs using electroreflectance spectroscopy | 신동수 |
2014-09 | Measurement of piezoelectric field in single- and double-quantum-well green LEDs using electroreflectance spectroscopy | 신동수 |
2019-10 | Measurement of the piezoelectric field in InGaN/AlGaN multiple-quantum-well near-ultraviolet light-emitting diodes by electroreflectance spectroscopy | 신동수 |
2018-09 | Measurements of various light-emitting-diode efficiencies at room temperature | 신동수 |
2018-04 | Measuring the Internal Quantum Efficiency of Light-Emitting Diodes at an Arbitrary Temperature | 신동수 |
2018-04 | Measuring the Internal Quantum Efficiency of Light-Emitting Diodes at an Arbitrary Temperature | 신동수 |
2018-10 | Measuring the internal quantum efficiency of light-emitting diodes: towards accurate and reliable room-temperature characterization | 신동수 |
2018-10 | Measuring the internal quantum efficiency of light-emitting diodes: towards accurate and reliable room-temperature characterization | 신동수 |
2021-05 | Measuring the surface temperature of light-emitting diodes by thermoreflectance | 신동수 |
2019-08 | Modified Shockley equation for GaInN-based light-emitting diodes: Origin of the power-efficiency degradation under high current injection | 신동수 |
2023-04-26 | Native defect clustering-induced carrier localization centers leading to a reduction of performance in Ga0.70In0.30N/GaN quantum wells | 신동수 |