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Investigation of an erasing method for synaptic behaviour in a phase change device using Ge1Cu2Te3 (GCT)

Title
Investigation of an erasing method for synaptic behaviour in a phase change device using Ge1Cu2Te3 (GCT)
Author
송윤흡
Keywords
copper compounds; germanium compounds; phase change memories
Issue Date
2016-08
Publisher
INST ENGINEERING TECHNOLOGY-IET
Citation
ELECTRONICS LETTERS, v. 52, NO. 18, Page. 1514-1515
Abstract
The gradual erasing operation from reset state to set state adjusting pulse amplitude, duration time and falling time respectively in phase change device using Ge1Cu2Te3 is investigated. For this procedure, a relatively high voltage and increased falling time, which was able to produce both long-term potential and long-term depression in the time interval between pre-spike and post-spike is choosing. The results suggested that the presence of synaptic behaviour was due to controlled falling time rather than pulse amplitude.
URI
https://ieeexplore.ieee.org/document/7551312?arnumber=7551312&tag=1https://repository.hanyang.ac.kr/handle/20.500.11754/76329
ISSN
0013-5194; 1350-911X
DOI
10.1049/el.2016.2211
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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