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COLLEGE OF ENGINEERING SCIENCES[E](공학대학)
ELECTRICAL ENGINEERING(전자공학부)
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Results 21-30 of 85 (Search time: 0.006 seconds).
Item hits:
Issue Date
Title
Author(s)
2004-10
Removing JTAG Bottleneck in System Interconnect Test
백상현
2016-02
Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology
백상현
2016-02
Experiments and root cause analysis for active-precharge hammering fault in DDR3 SDRAM under 3 x nm technology
백상현
2015-06
중이온에 의한 SDRAM 컴포넌트의 리텐션 시간 측정 연구
백상현
2015-08
Supply Voltage Dependence of Heavy Ion Induced SEEs on 65 nm CMOS Bulk SRAMs
백상현
2016-10
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation
백상현
2016-09
A 65 nm Temporally Hardened Flip-Flop Circuit
백상현
2017-07
BPPT–Bulk Potential Protection Technique for Hardened Sequentials
백상현
2016-11
An Area Efficient Stacked Latch Design Tolerant to SEU in 28 nm FDSOI Technology
백상현
2017-01
Evaluation of SEU Performance of 28-nm FDSOI Flip-Flop Designs
백상현
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soft error
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single event upset
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TCAM
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DRAM
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low-power design
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memory architecture
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radiation hardening
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Soft error
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SRAM
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AC coupling
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2020 - 2023
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2010 - 2019
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2004 - 2009
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