211 0

Thermal Aware Buffer Insertion in the Early Stage of Physical Designs

Title
Thermal Aware Buffer Insertion in the Early Stage of Physical Designs
Author
정정화
Keywords
Buffer insertion; thermal variation; cell delay; library characterization
Issue Date
2012-12
Publisher
The Institute of Electronics Engineers of Korea
Citation
Journal of semiconductor technology and science, 2012, 12(4), P.397-404, 8P.
Abstract
Thermal generation by power dissipation of the highly integrated System on Chip (SoC) device is irregularly distributed on the intra chip. It leads to thermal increment of the each thermally different region and effects on the propagation timing; consequently, the timing violation occurs due to the misestimated number of buffers. In this paper, the timing budgeting methodology considering thermal variation which contains buffer insertion with wire segmentation is proposed. Thermal aware LUT modeling for cell intrinsic delay is also proposed. Simulation results show the reduction of the worst delay after implementing thermal aware buffer insertion using by proposed wire segmentation up to 33% in contrast to the original buffer insertion. The error rates are measured by SPICE simulation results.
URI
http://koreascience.or.kr/article/ArticleFullRecord.jsp?cn=E1STAN_2012_v12n4_397http://hdl.handle.net/20.500.11754/51228
ISSN
1598-1657
DOI
10.5573/JSTS.2012.12.4.397
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE