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dc.contributor.author권오경-
dc.date.accessioned2016-08-03T06:43:05Z-
dc.date.available2016-08-03T06:43:05Z-
dc.date.issued2015-02-
dc.identifier.citationELECTRONICS LETTERS, v. 51, NO 4, Page. 325-326en_US
dc.identifier.issn0013-5194-
dc.identifier.issn1350-911X-
dc.identifier.urihttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7042418&tag=1-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/22369-
dc.description.abstractA multi-sampling method with partial conversion for a low-noise and high-speed analogue-to-digital converter (ADC) is proposed. The proposed multi-sampling method divides the total bits of an ADC into upper and lower bits, and only repeats the lower bit conversion using the two-step ADC architecture. This partial conversion decreases the A/D conversion time, along with noise reduction by multi-sampling. The proposed method with pseudo-multi-sampling or correlated multi-sampling for lower bit conversion reduces the number of clock cycles by 99.7 or 98.8%, respectively, compared with the conventional multi-sampling method.en_US
dc.description.sponsorshipInstitution of Engineering and Technologyen_US
dc.language.isoenen_US
dc.publisherINST ENGINEERING TECHNOLOGY-IETen_US
dc.subjectanalogue-digital conversionen_US
dc.subjectsampling methodsen_US
dc.titleHigh-speed two-step single-slope ADC using multi-sampling with partial conversionen_US
dc.typeArticleen_US
dc.relation.no4-
dc.relation.volume51-
dc.identifier.doi10.1049/el.2014.3436-
dc.relation.page325-326-
dc.relation.journalELECTRONICS LETTERS-
dc.contributor.googleauthorKim, Jong-Boo-
dc.contributor.googleauthorHong, Seong-Kwan-
dc.contributor.googleauthorKwon, Oh-Kyong-
dc.relation.code2015001404-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidokwon-
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COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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