Fully Differential Flash-ADC의 대칭성기반 자가보정기법

Abstract

Flash analog-to-digital converters (ADCs) suffer significantly from variations of the offset voltage in sub-micron process technology, resulting in degradation of the linearity. This paper proposes a method to reduce the process time to calibrate the nonlinearity caused by imperfect fabrication process and by the inherent configuration of fully differential flash ADC. The symmetricity of the resistor string can be efficiently used based on our previous work in order to the calibration process time. The behavioral simulation results using a 6-bit ADC showed the process time has been significantly reduced using the proposed method.