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Large-Scale Parallel Cognitive Diagnostic Test Assembly Using A Dual-Stage Differential Evolution-Based Approach

Title
Large-Scale Parallel Cognitive Diagnostic Test Assembly Using A Dual-Stage Differential Evolution-Based Approach
Author
Jun Zhang
Issue Date
2023-12
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
IEEE Transactions on Artificial Intelligence, Page. 1-14
URI
https://repository.hanyang.ac.kr/handle/20.500.11754/188038
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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