Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential Signaling
- Title
- Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential Signaling
- Author
- 백상현
- Keywords
- Capacitor; differential signaling; fault; pattern-dependent jitter (PDJ); test buffer
- Issue Date
- 2009-08
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Citation
- IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v. 58, NO. 8, Page. 2544-2556
- Abstract
- This paper presents a novel method for detecting defective ac-coupling capacitors in high-speed differential signaling connections by designing a circuit with detectors at the differential receiver. The design parameters of selecting the ranges in the receiver buffer are proposed to efficiently detect the voltage droop that creates erroneous jitter. The detectors in the proposed method enable the use of a lower test signal speed than the mission data rate at differential connections to detect defective capacitors. The proposed design method of detectors combines four design and test factors, namely, regular , voltage doubling, fail-safe, and defect sensitization, to determine the stretched used for test purposes. The -detection scheme has been implemented and verified in the design using a regular current-mode logic (CML) differential buffer in the 0.18-mu m complementary metal-oxide-semiconductor (CMOS) process. The detection capability of the proposed method to check for traditional defects with the same detector is also demonstrated through SPICE-based fault simulations. The proposed method is also verified with the board developed for parameter measurements. The parameters proposed in this paper showed excellent agreement among calculated, simulated, and measured values. In particular, measured parameters showed strong closeness up to 99% to its calculated values.
- URI
- https://ieeexplore.ieee.org/document/4797825https://repository.hanyang.ac.kr/handle/20.500.11754/183633
- ISSN
- 0018-9456;1557-9662
- DOI
- 10.1109/TIM.2009.2014624
- Appears in Collections:
- COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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