Direct Evidence of Electronic Interaction at the Atomic-Layer-Deposited MoS2Monolayer/SiO2Interface
- Title
- Direct Evidence of Electronic Interaction at the Atomic-Layer-Deposited MoS2Monolayer/SiO2Interface
- Author
- 박태주
- Keywords
- electronic structure; interface; MoS2; SiO2; synchrotron X-ray photoelectron spectroscopy; van der Waals interaction; X-ray absorption spectroscopy
- Issue Date
- 2020-12
- Publisher
- American Chemical Society
- Citation
- ACS Applied Materials and Interfaces, v. 12, NO. 48, Page. 53852-53859
- Abstract
- The electronic structure of an atomic-layer-deposited MoS2 monolayer on SiO2 was investigated using X-ray absorption spectroscopy (XAS) and synchrotron X-ray photoelectron spectroscopy (XPS). The angle-dependent evolution of the XAS spectra and the photon-energy-dependent evolution of the XPS spectra were analyzed in detail using an ab initio electronic structure simulation. Although similar to the theoretical spectra of an ideal free-standing MoS2 ML, the experimental spectra exhibit features that are distinct from those of an ideal ML, which can be interpreted as a consequence of S-O van der Waals (vdW) interactions. The strong consensus among the experimental and theoretical spectra suggests that the vdW interactions between MoS2 and adjacent SiO2 layers can influence the electronic structure of the system, manifesting a substantial electronic interaction at the MoS2-SiO2 interface. ©
- URI
- https://pubs.acs.org/doi/10.1021/acsami.0c17544https://repository.hanyang.ac.kr/handle/20.500.11754/181543
- ISSN
- 1944-8244;1944-8252
- DOI
- 10.1021/acsami.0c17544
- Appears in Collections:
- COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MATERIALS SCIENCE AND CHEMICAL ENGINEERING(재료화학공학과) > Articles
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