Repository at Hanyang UniversityCOLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학)PHOTONICS AND NANOELECTRONICS(나노광전자학과)Articles
194
0
Impact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters
- Title
- Impact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters
- Author
- 김영현
- Issue Date
- 2022-09
- Publisher
- IEEE
- Citation
- 2022 EUROPEAN CONFERENCE ON OPTICAL COMMUNICATION (ECOC),
- Abstract
- We report the reliability assessment of carrier-depletion p-n diode GaAs/Si optical modulators monolithically integrated on a 300-mm Si wafer. Dark current remains stable under long accelerating aging tests. Devices without seed annealing experience a shift of Vp. Lp with no stress temperature dependence. (C) 2022 The Author(s)
- URI
- https://ieeexplore.ieee.org/document/9979220?arnumber=9979220&SID=EBSCO:edseeehttps://repository.hanyang.ac.kr/handle/20.500.11754/179149
- Appears in Collections:
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > PHOTONICS AND NANOELECTRONICS(나노광전자학과) > Articles
- Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
