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Ultralow temperature solution processed gate dielectrics using molecular structured precursors and highly energetic photochemical process

Title
Ultralow temperature solution processed gate dielectrics using molecular structured precursors and highly energetic photochemical process
Author
김재균
Issue Date
2017-07
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
AM-FPD 2017 - 24th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings, article no. 8006155, Page. 292-295
Abstract
We report a new strategy for obtaining an ultralow temperature solution derived metal-oxide dielectric such alumina, by using molecular clusters (MCs) (aluminium-oxo-hydroxy cluster, Al-13) as a precursor and local structure controllable activation process via deep-ultraviolet (DUV)-induced photochemical activation. We show that the combination of Al-13 MC precursor and the spatially controllable photochemical activation enables the formation of highly dense oxide (Al2O3) thin films at an ultralow temperature (< 60C), through an efficient integration of the dissociated skeleton of the MC precursors. Finally, to demonstrate the versatility of the ultralow-Temperature-Annealed and large area ceramic dielectrics, metal-oxide TFTs, carbon nanotube TFTs and integrated circuits were fabricated directly both on ultrathin (thickness < 3 m) polymeric and low thermal budget stretchable substrates. The metal-oxide TFTs and 7-stage ring oscillator circuits showed an average mobility of 5 cm2 V-1 s-1 with a narrow distribution of the performance and good operational stability, and oscillation frequency greater than 1 MHz with corresponding propagation delay less than 70 ns per stage, respectively.
URI
https://ieeexplore.ieee.org/abstract/document/8006155https://repository.hanyang.ac.kr/handle/20.500.11754/177602
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > PHOTONICS AND NANOELECTRONICS(나노광전자학과) > Articles
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