Interface Carriers and Enhanced Electron-Phonon Coupling Effect in Al2O3/TiO2 Heterostructure Revealed by Resonant Inelastic Soft X-Ray Scattering
- Title
- Interface Carriers and Enhanced Electron-Phonon Coupling Effect in Al2O3/TiO2 Heterostructure Revealed by Resonant Inelastic Soft X-Ray Scattering
- Author
- 박태주
- Keywords
- 2D electron gas; aluminum oxide; dd excitation; electron-phonon coupling; oxide heterostructures; resonant inelastic X-ray scattering; titanium oxide
- Issue Date
- 2021-08
- Publisher
- WILEY-V C H VERLAG GMBH
- Citation
- ADVANCED FUNCTIONAL MATERIALS, v. 31, NO 35, Page. 1-9
- Abstract
- The electronic structure and the electron-phonon couplings in a novel mass-production-compatible Al2O3/TiO2 2D electron system (2DES) are investigated using resonant inelastic soft X-ray scattering. The experimental data from the samples of various TiO2 thicknesses unequivocally show that the Ti3+ state indeed exists at the deep interface to serve as an n-type dopant for the 2DES. The electronic structure of Ti3+ species is scrutinized as entirely separated from that of the Ti4+ host lattice. Furthermore, features of sub-eV energy loss phonon modes are clearly observed, indicating substantial electron-phonon coupling effects. Such low energy loss features are enhanced in thinner TiO2 samples, implying that polaronic local lattice deformation is enhanced due to the presence of Ti3+. These findings suggest that the 2DES properties can be controlled via well-established TiO2 engineering, thereby enthroning the binary oxide heterostructure as a promising candidate for 2DES device applications.
- URI
- https://onlinelibrary.wiley.com/doi/full/10.1002/adfm.202104430https://repository.hanyang.ac.kr/handle/20.500.11754/168795
- ISSN
- 1616301X; 16163028
- DOI
- 10.1002/adfm.202104430
- Appears in Collections:
- COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MATERIALS SCIENCE AND CHEMICAL ENGINEERING(재료화학공학과) > Articles
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