코아의 기능성 래퍼를 IEEE 1500 래퍼로 재사용하기 위한 디자인 기법
- Title
- 코아의 기능성 래퍼를 IEEE 1500 래퍼로 재사용하기 위한 디자인 기법
- Other Titles
- A Design Technique to Reuse Functional Wrapper as IEEE 1500 Compliant Test Wrapper
- Author
- 박성주
- Keywords
- IEEE 1500 wrapper; test wrapper
- Issue Date
- 2009-06
- Publisher
- 한국반도체테스트협회
- Citation
- 한국테스트학술대회 2009, 2pp
- Abstract
- 테스트랩퍼를 포함한 기능성팹퍼 제안. With the scalability of SoC (System-on-a-Chip), the complexity and the area overhead of test logic are also increasing. Especially the area overhead of design for testable (DFT) logic including IEEE 1500 std. compliant test wrapper has reached approximately 10% of actual design. This paper introduces a design technique to reuse functional wrapper as IEEE 1500 compliant test wrapper which reduces DFT area overhead significantly.
- URI
- http://www.koreatest.or.kr/sub02/2009data/report/l09-038.pdfhttps://repository.hanyang.ac.kr/handle/20.500.11754/166018
- Appears in Collections:
- ETC[S] > 연구정보
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