2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157), v. 3, page. 1727-1730
Abstract
The frequency-variant characteristics of a silicon substrate were physically modeled, analytically investigated, and experimentally verified. The scalable circuit model parameter extraction methodology was newly developed. Thus, the proposed technique can provides the efficient performance evaluations as well as the accurate design guidelines concerned with the complicated mixed signal integrated circuit designs.