Microcode-based memory BIST implementing modified march algorithms
- Title
- Microcode-based memory BIST implementing modified march algorithms
- Author
- 도경구
- Issue Date
- 2002-04
- Publisher
- KOREAN PHYSICAL SOC(한국물리학회)
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, page. 391-395
- Abstract
- A new microcode-based BIST(built-in self test) circuitry for embedded memory
components is proposed in this paper. The memory BIST implements march algorithms
which are slightly modified by adopting degree of freedom concept to detect
address decoder open faults on top of conventional stuck faults.
Furthermore, it is shown that the BIST-modified march can capture
a few neighborhood pattern sensitive faults coupled with the cellular automata
addresss generator and patterns. The proposed microcode-based memory BIST
lends itself to performing different combinations of march and retention tests
with less microcode storage than the other approaches.
- URI
- https://ieeexplore.ieee.org/document/990315?arnumber=990315&SID=EBSCO:edseeehttps://repository.hanyang.ac.kr/handle/20.500.11754/157304
- ISBN
- 0-7695-1378-6; 978-0-7695-1378-2
- ISSN
- 1081-7735
- DOI
- 10.1109/ATS.2001.990315
- Appears in Collections:
- ETC[S] > 연구정보
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