Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 도경구 | - |
dc.date.accessioned | 2021-01-21T02:32:30Z | - |
dc.date.available | 2021-01-21T02:32:30Z | - |
dc.date.issued | 2002-04 | - |
dc.identifier.citation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, page. 391-395 | en_US |
dc.identifier.isbn | 0-7695-1378-6 | - |
dc.identifier.isbn | 978-0-7695-1378-2 | - |
dc.identifier.issn | 1081-7735 | - |
dc.identifier.uri | https://ieeexplore.ieee.org/document/990315?arnumber=990315&SID=EBSCO:edseee | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/157304 | - |
dc.description.abstract | A new microcode-based BIST(built-in self test) circuitry for embedded memory components is proposed in this paper. The memory BIST implements march algorithms which are slightly modified by adopting degree of freedom concept to detect address decoder open faults on top of conventional stuck faults. Furthermore, it is shown that the BIST-modified march can capture a few neighborhood pattern sensitive faults coupled with the cellular automata addresss generator and patterns. The proposed microcode-based memory BIST lends itself to performing different combinations of march and retention tests with less microcode storage than the other approaches. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | KOREAN PHYSICAL SOC(한국물리학회) | en_US |
dc.title | Microcode-based memory BIST implementing modified march algorithms | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/ATS.2001.990315 | - |
dc.relation.journal | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.contributor.googleauthor | Dongkyu Youn | - |
dc.contributor.googleauthor | Taehyung Kim | - |
dc.contributor.googleauthor | Sungju Park | - |
dc.relation.code | 2009205987 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF COMPUTING[E] | - |
dc.sector.department | DIVISION OF COMPUTER SCIENCE | - |
dc.identifier.pid | doh | - |
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