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Analytical Signal Integrity Verification Models for Inductance-Dominant Multi-Coupled VLSI Interconnects

Title
Analytical Signal Integrity Verification Models for Inductance-Dominant Multi-Coupled VLSI Interconnects
Author
심종인
Issue Date
2002-04
Publisher
IEEE/ACM
Citation
International Workshop on System Level Interconnect Prediction, page. 61-68
Abstract
Novel signal integrity verification models for inductancedominant RLC interconnect lines are developed by using a traveling-wave-based waveform approximation (TWA) technique. The multi-coupled line responses are decoupled into the eigenmodes of the system in order to exploit the TWA technique. Then, the response signals are mathematically represented by the linear combination of each eigenmode response based on TWA, followed by reporting the signal integrity models for the multi-coupled lines. The signal integrity of VLSI circuit interconnects has a strong correlation with input signal switching-patterns in the multiple lines. With the proposed analytic signal integrity models, the switching-dependent signal delay, crosstalk, ringing, and glitches of the inductance-dominant RLC interconnect lines can be accurately as well as efficiently determined. It is shown that the models have excellent agreement with SPICE simulations.
URI
https://dl.acm.org/doi/abs/10.1145/505348.505361?https://repository.hanyang.ac.kr/handle/20.500.11754/157248
ISBN
978-1-58113-481-0; 1-58113-481-9
DOI
10.1145/505348.505361
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > PHOTONICS AND NANOELECTRONICS(나노광전자학과) > Articles
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