TEM을 이용한 100nm표준입자크기의 인증

Title
TEM을 이용한 100nm표준입자크기의 인증
Author
안강호
Issue Date
2003-07
Publisher
KAPAR
URI
https://repository.hanyang.ac.kr/handle/20.500.11754/156067
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MECHANICAL ENGINEERING(기계공학과) > Articles
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