Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 강보수 | - |
dc.date.accessioned | 2020-11-03T01:48:21Z | - |
dc.date.available | 2020-11-03T01:48:21Z | - |
dc.date.issued | 2003-01 | - |
dc.identifier.citation | Applied Physics Letters. v.82, no.2, page.248-250 | en_US |
dc.identifier.issn | 00036951 | - |
dc.identifier.uri | https://aip.scitation.org/doi/10.1063/1.1534411 | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/155154 | - |
dc.description.abstract | Short-time retention loss behaviors were investigated for fatigued Pt/PbZr0.4Ti0.6O3/Pt capacitors. In the short-time regime of t<1 s, fatigued capacitors showed a significant loss in retained polarization, which could be well described by a power-law function. This behavior was interpreted in terms of a superposition of polarization relaxations with a relaxation time distribution. The effects of the pulse voltage on the relaxation time distribution suggested that the retention loss should be activated by a depolarization field. As the fatigue stress was applied, the retention loss became worse. This effect can be explained in terms of the increase of the depolarization field, possibly due to the growth of an interfacial passive layer. (C) 2003 American Institute of Physics. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | AMER INST PHYSICS | en_US |
dc.title | Polarization dynamics and retention loss in fatigued PbZr0.4Ti0.6O3 ferroelectric capacitors | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.1534411 | - |
dc.relation.journal | APPLIED PHYSICS LETTERS | - |
dc.contributor.googleauthor | Kang, B. S. | - |
dc.contributor.googleauthor | Yoon, Jong-Gul | - |
dc.contributor.googleauthor | Noh, T. W. | - |
dc.relation.code | 2007200866 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E] | - |
dc.sector.department | DEPARTMENT OF APPLIED PHYSICS | - |
dc.identifier.pid | bosookang | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.