215 0

Full metadata record

DC FieldValueLanguage
dc.contributor.author강보수-
dc.date.accessioned2020-11-03T01:48:21Z-
dc.date.available2020-11-03T01:48:21Z-
dc.date.issued2003-01-
dc.identifier.citationApplied Physics Letters. v.82, no.2, page.248-250en_US
dc.identifier.issn00036951-
dc.identifier.urihttps://aip.scitation.org/doi/10.1063/1.1534411-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/155154-
dc.description.abstractShort-time retention loss behaviors were investigated for fatigued Pt/PbZr0.4Ti0.6O3/Pt capacitors. In the short-time regime of t<1 s, fatigued capacitors showed a significant loss in retained polarization, which could be well described by a power-law function. This behavior was interpreted in terms of a superposition of polarization relaxations with a relaxation time distribution. The effects of the pulse voltage on the relaxation time distribution suggested that the retention loss should be activated by a depolarization field. As the fatigue stress was applied, the retention loss became worse. This effect can be explained in terms of the increase of the depolarization field, possibly due to the growth of an interfacial passive layer. (C) 2003 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.publisherAMER INST PHYSICSen_US
dc.titlePolarization dynamics and retention loss in fatigued PbZr0.4Ti0.6O3 ferroelectric capacitorsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.1534411-
dc.relation.journalAPPLIED PHYSICS LETTERS-
dc.contributor.googleauthorKang, B. S.-
dc.contributor.googleauthorYoon, Jong-Gul-
dc.contributor.googleauthorNoh, T. W.-
dc.relation.code2007200866-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E]-
dc.sector.departmentDEPARTMENT OF APPLIED PHYSICS-
dc.identifier.pidbosookang-
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > APPLIED PHYSICS(응용물리학과) > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE