A Reconfigurable Test Access Mechanism for Embedded Core Test
- Title
- A Reconfigurable Test Access Mechanism for Embedded Core Test
- Author
- 박성주
- Keywords
- P1500 Wrapper; TAM(Test Access Mechanism); Scan Design
- Issue Date
- 2004-10
- Publisher
- 대한전자공학회
- Citation
- ISOCC 2004 Conference, Page. 506-509
- Abstract
- For a System-on-a-Chip(SoC) comprised of
multiple IP cores, various design techniques have been
proposed to provide diverse test link configurations for
wrapper and scan chains. In this paper, a simple test
access mechanism is introduced, where scan chains are
efficiently reconfigured. An SoC comprising of interactive
and non-interactive mega-cores of various scan
architectures can be effectively tested with this
mechanism. Design experiments show that functionality,
compatability, scalability, and area overhead of our
technique are highly competitive to the current state-of art
techniques.
- URI
- https://dbpia.co.kr/journal/articleDetail?nodeId=NODE01810825https://repository.hanyang.ac.kr/handle/20.500.11754/152141
- Appears in Collections:
- COLLEGE OF COMPUTING[E](소프트웨어융합대학) > COMPUTER SCIENCE(소프트웨어학부) > Articles
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