ANALYSIS OF RECENT SECURE SCAN TEST TECHNIQUES

Abstract

When scan test techniques are applied for cryptographic chips, side channel attack may result in user key leakage. Many secure scan designs have been proposed to protect the user key. This paper meticulously selects three current scan test techniques and analyses their advantages and disadvantages. The paper also compares them in several aspects, such as security and area overhead. User can choose one of them according to the requirements; further combination can be implemented to achieve better performance.