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dc.contributor.author박상규-
dc.date.accessioned2019-12-08T04:44:41Z-
dc.date.available2019-12-08T04:44:41Z-
dc.date.issued2018-05-
dc.identifier.citationIEEE TRANSACTIONS ON MAGNETICS, v. 54, no. 5, Article no. 3400607en_US
dc.identifier.issn0018-9464-
dc.identifier.issn1941-0069-
dc.identifier.urihttps://ieeexplore.ieee.org/document/8291058-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/118774-
dc.description.abstractSpin-transfer torque magnetic random memory (STT-MRAM) is a promising candidate for universal memory due to its non-volatility, fast access speed, high density, and low power consumption. In this paper, we propose a read-and-write circuit for STT-MRAMs, which decreases energy consumption and improves the endurance of STT-MRAM cells. The proposed circuit is capable of terminating write operations when the state of the cell has been switched to the desired one. In the circuit, the read and write operations share a single current driver. The proposed circuit including all the digital logic parts has been implemented using a CMOS process and validated using SPICE-level simulations.en_US
dc.description.sponsorshipThis work was supported by the Future Semiconductor Device Technology Development Program under Grant 10044608 funded by the Ministry of Trade, Industry and Energy and Korea Semiconductor Research Consortium. The CAD tools were provided by IC Design Education Center, South Korea.en_US
dc.language.isoen_USen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.subjectEnergy consumptionen_US
dc.subjectread circuiten_US
dc.subjectreliabilityen_US
dc.subjectspin-transfer torque magnetic random memory (STT-MRAM)en_US
dc.subjectstochastic behavioren_US
dc.subjectwrite circuiten_US
dc.titleRead-Write Circuit for STT-MRAM With Stochastic Switchingsen_US
dc.typeArticleen_US
dc.relation.no5-
dc.relation.volume54-
dc.identifier.doi10.1109/TMAG.2018.2795542-
dc.relation.page607-607-
dc.relation.journalIEEE TRANSACTIONS ON MAGNETICS-
dc.contributor.googleauthorIm, Il-Young-
dc.contributor.googleauthorPark, Sang-Gyu-
dc.relation.code2018003453-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidsanggyu-
dc.identifier.orcidhttps://orcid.org/0000-0002-6051-0163-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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