Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김옥경 | - |
dc.date.accessioned | 2019-08-05T05:33:37Z | - |
dc.date.available | 2019-08-05T05:33:37Z | - |
dc.date.issued | 2006-06 | - |
dc.identifier.citation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v. 48, No. 6, Page. 1273-1276 | en_US |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.issn | 1976-8524 | - |
dc.identifier.uri | http://www.jkps.or.kr/journal/view.html?uid=7602&vmd=Full | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/108219 | - |
dc.description.abstract | Wet etching of thin copper films was achieved by using chlorine-based liquids, such as 1,2-dicholorethane or NaCl dissolved in water, under ultraviolet (UV) irradiation. The etching of the thin copper film was probed in-situ by using a spectroscopic ellipsometer, and the etch rate could be controlled by adjusting the exposure parameters. As UV is used in lithography, mask patterns can be transferred to a copper surface directly without resorting to a complex photoresist process. Easy control of the etch rate ranging from sub A/s and use of nontoxic liquids such as 1,2-dicholoroethane and NaCl solution are major advantages of this novel technique. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | 한국물리학회 | en_US |
dc.subject | copper films | en_US |
dc.subject | etching | en_US |
dc.subject | ultraviolet radiation | en_US |
dc.subject | chlorine | en_US |
dc.title | Patterning of Thin Copper Films under UV Exposure in Chlorine-Based Liquids | en_US |
dc.type | Article | en_US |
dc.relation.journal | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.contributor.googleauthor | Chattopadhyay, K. K. | - |
dc.contributor.googleauthor | Cho, Jongkyu | - |
dc.contributor.googleauthor | Kwak, Jihoon | - |
dc.contributor.googleauthor | Kyoung, Jaisun | - |
dc.contributor.googleauthor | Kim, Okkyung | - |
dc.contributor.googleauthor | An, Ilsin | - |
dc.relation.code | 2009205987 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E] | - |
dc.sector.department | DEPARTMENT OF APPLIED PHYSICS | - |
dc.identifier.pid | 1790146 | - |
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