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dc.contributor.author김옥경-
dc.date.accessioned2019-08-05T05:33:37Z-
dc.date.available2019-08-05T05:33:37Z-
dc.date.issued2006-06-
dc.identifier.citationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v. 48, No. 6, Page. 1273-1276en_US
dc.identifier.issn0374-4884-
dc.identifier.issn1976-8524-
dc.identifier.urihttp://www.jkps.or.kr/journal/view.html?uid=7602&vmd=Full-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/108219-
dc.description.abstractWet etching of thin copper films was achieved by using chlorine-based liquids, such as 1,2-dicholorethane or NaCl dissolved in water, under ultraviolet (UV) irradiation. The etching of the thin copper film was probed in-situ by using a spectroscopic ellipsometer, and the etch rate could be controlled by adjusting the exposure parameters. As UV is used in lithography, mask patterns can be transferred to a copper surface directly without resorting to a complex photoresist process. Easy control of the etch rate ranging from sub A/s and use of nontoxic liquids such as 1,2-dicholoroethane and NaCl solution are major advantages of this novel technique.en_US
dc.language.isoen_USen_US
dc.publisher한국물리학회en_US
dc.subjectcopper filmsen_US
dc.subjectetchingen_US
dc.subjectultraviolet radiationen_US
dc.subjectchlorineen_US
dc.titlePatterning of Thin Copper Films under UV Exposure in Chlorine-Based Liquidsen_US
dc.typeArticleen_US
dc.relation.journalJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.contributor.googleauthorChattopadhyay, K. K.-
dc.contributor.googleauthorCho, Jongkyu-
dc.contributor.googleauthorKwak, Jihoon-
dc.contributor.googleauthorKyoung, Jaisun-
dc.contributor.googleauthorKim, Okkyung-
dc.contributor.googleauthorAn, Ilsin-
dc.relation.code2009205987-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E]-
dc.sector.departmentDEPARTMENT OF APPLIED PHYSICS-
dc.identifier.pid1790146-
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > APPLIED PHYSICS(응용물리학과) > Articles
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