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dc.contributor.author강보수-
dc.date.accessioned2019-07-09T04:22:44Z-
dc.date.available2019-07-09T04:22:44Z-
dc.date.issued2007-10-
dc.identifier.citationAPPLIED PHYSICS LETTERS, v. 91, No. 14, Article no. 142901en_US
dc.identifier.issn0003-6951-
dc.identifier.issn1077-3118-
dc.identifier.urihttps://aip.scitation.org/doi/abs/10.1063/1.2780118-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/107197-
dc.description.abstractFerroelectric Bi3.25La0.75Ti3O12 (BLT) thin films were deposited on SrRuO3 (SRO) and Pt electrodes by pulsed laser deposition. The data retention characteristics of the BLT films on different electrode materials were characterized. The experimental results are well fitted by a stretched exponential decay model, indicating that BLT films on both Pt and SRO exhibit the similar decay mechanisms. However, the decay behavior is quite different due to the use of different bottom electrodes. The superior data retention performance of BLT film on conductive SRO electrode is believed to be from the reduction of domain polarization backswitching originated from the oxygen vacancies in the depletion region of BLT films. (c) 2007 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.publisherAMER INST PHYSICSen_US
dc.subjectHYDROGEN-INDUCED DEGRADATIONen_US
dc.subjectPOLARIZATION RETENTIONen_US
dc.subjectCAPACITORSen_US
dc.subjectNANOSCALEen_US
dc.subjectMEMORIESen_US
dc.subjectTITANATEen_US
dc.subjectCRYSTALen_US
dc.subjectIRO2en_US
dc.titleData retention characteristics of Bi3.25La0.75Ti3O12 thin films on conductive SrRuO3 electrodesen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2780118-
dc.relation.journalAPPLIED PHYSICS LETTERS-
dc.contributor.googleauthorLee, Jang-Sik-
dc.contributor.googleauthorKang, B. S.-
dc.contributor.googleauthorJia, Q. X.-
dc.relation.code2007200866-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E]-
dc.sector.departmentDEPARTMENT OF APPLIED PHYSICS-
dc.identifier.pidbosookang-
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