Degradation Analysis of Nano-Contamination in Plasma Display Panels
- Title
- Degradation Analysis of Nano-Contamination in Plasma Display Panels
- Author
- 강창욱
- Keywords
- accelerated degradation testing; burn-in; nano-contamination; plasma display panel; random-coefficients model
- Issue Date
- 2008-06
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Citation
- IEEE TRANSACTIONS ON RELIABILITY, v. 57, No. 2, Page. 222-229
- Abstract
- As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article proposes a new model to describe the nonlinear degradation paths caused by nano-contamination in plasma display panels (PDP): a bi-exponential model with random coefficients. A likelihood ratio test was sequentially executed to select random effects in the nonlinear model. Analysis results indicate that the reliability estimation can be improved substantially by using the nonlinear random-coefficients model to incorporate both inherent degradation characteristics, and contamination effects of impurities for PDP degradation paths.
- URI
- https://ieeexplore.ieee.org/document/4470003https://repository.hanyang.ac.kr/handle/20.500.11754/80473
- ISSN
- 0018-9529
- DOI
- 10.1109/TR.2008.917823
- Appears in Collections:
- COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > INDUSTRIAL AND MANAGEMENT ENGINEERING(산업경영공학과) > Articles
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