Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 강창욱 | - |
dc.date.accessioned | 2018-11-16T05:48:02Z | - |
dc.date.available | 2018-11-16T05:48:02Z | - |
dc.date.issued | 2008-06 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON RELIABILITY, v. 57, No. 2, Page. 222-229 | en_US |
dc.identifier.issn | 0018-9529 | - |
dc.identifier.uri | https://ieeexplore.ieee.org/document/4470003 | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/80473 | - |
dc.description.abstract | As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article proposes a new model to describe the nonlinear degradation paths caused by nano-contamination in plasma display panels (PDP): a bi-exponential model with random coefficients. A likelihood ratio test was sequentially executed to select random effects in the nonlinear model. Analysis results indicate that the reliability estimation can be improved substantially by using the nonlinear random-coefficients model to incorporate both inherent degradation characteristics, and contamination effects of impurities for PDP degradation paths. | en_US |
dc.description.sponsorship | The authors would like to thank the anonymous referees who helped them gain substantial improvements in the manuscript. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | en_US |
dc.subject | accelerated degradation testing | en_US |
dc.subject | burn-in | en_US |
dc.subject | nano-contamination | en_US |
dc.subject | plasma display panel | en_US |
dc.subject | random-coefficients model | en_US |
dc.title | Degradation Analysis of Nano-Contamination in Plasma Display Panels | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TR.2008.917823 | - |
dc.relation.journal | IEEE TRANSACTIONS ON RELIABILITY | - |
dc.contributor.googleauthor | Bae, Suk Joo | - |
dc.contributor.googleauthor | Kim, Seong-Joon | - |
dc.contributor.googleauthor | Kim, Man Soo | - |
dc.contributor.googleauthor | Lee, Bae Jin | - |
dc.contributor.googleauthor | Kang, Chang Wook | - |
dc.relation.code | 2008203892 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF ENGINEERING SCIENCES[E] | - |
dc.sector.department | DEPARTMENT OF INDUSTRIAL AND MANAGEMENT ENGINEERING | - |
dc.identifier.pid | cwkang57 | - |
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