2023-09 | A Novel Methodology for Estimating Technology Value and Importance of Factors in Market-Based Approach | 김병훈 |
2017-10 | Data mining-based variable assessment methodology for evaluating the contribution of knowledge services of a public research institute to business performance of firms | 김병훈 |
2021-08 | A dynamic graph-based approach to ranking firms for identifying key players using inter-firm transactions | 김병훈 |
2019-07 | A generalised uncertain decision tree for defect classification of multiple wafer maps | 김병훈 |
2015-02 | Graph kernel based measure for evaluating the influence of patents in a patent citation network | 김병훈 |
2022-11 | A Group Feature Ranking and Selection Method Based on Dimension Reduction Technique in High-Dimensional Data | 김병훈 |
2021-01 | Integrating Machine Learning, Radio Frequency Identification, and Consignment Policy for Reducing Unreliability in Smart Supply Chain Management | 김병훈 |
2019-08 | Maintenance Optimization for Repairable Deteriorating Systems under Imperfect Preventive Maintenance | 김병훈 |
2021-04 | Methodology for assessing the contribution of knowledge services during the new product development process to business performance | 김병훈 |
2015-03 | Modelling of technology lifetime based on patent citation data and segmentation | 김병훈 |
2022-06 | Multi-class Data Description 기반의 웨이퍼 빈 맵 불량 패턴 분류 및 신규 불량 패턴 검출방법 | 김병훈 |
2015-05 | New multi-stage similarity measure for calculation of pairwise patent similarity in a patent citation network | 김병훈 |
2021-08 | New multivariate kernel density estimator for uncertain data classification | 김병훈 |
2024-04-09 | A New Permutation-Based Method for Ranking and Selecting Group Features in Multiclass Classification | 김병훈 |
2019-08 | A Novel Method for Identifying Competitors Using a Financial Transaction Network | 김병훈 |
2016-11 | Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery | 김병훈 |
2015-02 | A regularized singular value decomposition-based approach for failure pattern classification on fail bitmap in a DRAM Wafer | 김병훈 |
2020-04 | REGULARIZING ACTIVATIONS IN NEURAL NETWORKS VIA DISTRIBUTION MATCHING WITH THE WASSERSTEIN METRIC | 김병훈 |
2016-02 | Step-Down Spatial Randomness Test for Detecting Abnormalities in DRAM Wafers with Multiple Spatial Maps | 김병훈 |
2017-10 | Two-phase edge outlier detection method for technology opportunity discovery | 김병훈 |