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Two-phase edge outlier detection method for technology opportunity discovery

Title
Two-phase edge outlier detection method for technology opportunity discovery
Author
김병훈
Keywords
Edge outlier; Outlier detection; Technology convergence; Technology opportunity discovery; Patent citation network
Issue Date
2017-10
Publisher
SPRINGER
Citation
SCIENTOMETRICS, v. 113, No. 1, Page. 1-16
Abstract
This article introduces a method for identifying potential opportunities of innovation arising from the convergence of different technological areas, based on the presence of edge outliers in a patent citation network. Edge outliers are detected via the assessment of their centrality; pairs of patents connected by edge outliers are then analyzed for technological relatedness and past involvement in technological convergence. The pairs with the highest potential for future convergence are finally selected and their keywords combined to suggest new directions of innovation. We illustrate our method on a data set of US patents in the field of digital information and security.
URI
https://link.springer.com/article/10.1007/s11192-017-2472-1http://repository.hanyang.ac.kr/handle/20.500.11754/99234
ISSN
0138-9130; 1588-2861
DOI
10.1007/s11192-017-2472-1
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > INDUSTRIAL AND MANAGEMENT ENGINEERING(산업경영공학과) > Articles
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