Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications
- Title
- Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications
- Author
- 김병호
- Keywords
- Analog-to-digital converter (ADC); digital-toanalog converter (DAC); loopback test; mixed-signal testing; ANALOG; CIRCUITS
- Issue Date
- 2016-02
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Citation
- IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v. 63, No. 2, Page. 121-125
- Abstract
- Lower cost test solutions are required to overcome high test cost issue of conventional characterization for the mixed-signal circuits, which is primarily caused by test equipment cost. This brief proposes a cost-effective self-characterization technique that accurately predicts the harmonics of individual mixed-signal circuits by dithering a loopback path with Gaussian-distributed noise. A set of scale factors is applied to the dithered root-mean-square noise. The different scale factors yield a corresponding change in the harmonic magnitudes of the loopback responses. Based on this, we derive a precise nonlinear loopback behaviormodel to quantitatively identify the harmonics of a device under test. The results show that the proposed method can be used for practical characterization.
- URI
- http://ieeexplore.ieee.org/abstract/document/7277065/http://hdl.handle.net/20.500.11754/49827
- ISSN
- 1549-7747; 1558-3791
- DOI
- 10.1109/TCSII.2015.2482419
- Appears in Collections:
- COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
- Files in This Item:
There are no files associated with this item.
- Export
- RIS (EndNote)
- XLS (Excel)
- XML